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Cross correlations between charge noise and critical-current fluctuations in a four-level tunable Josephson system

Source: Phys. Rev. B 81, 052505 (2010); doi:10.1103/PhysRevB.81.052505

Published 23 February 2010

PACS
  • 85.25.Cp
    Josephson devices
  • 03.65.Yz
    Decoherence; open systems; quantum statistical methods
  • 73.23.-b
    Electronic transport in mesoscopic systems
  • YEAR: 2010
PUBLICATION DATA
Publisher:
AIP is a member of CrossRef APS
Lara Faoro1,2,3 and Frank W. J. Hekking3
1Laboratoire de Physique Théorique et Hautes Énergies, CNRS UMR 7589, Universités Paris 6 et 7, 4 place Jussieu, 75252 Paris Cedex 05, France
2Department of Physics and Astronomy, Rutgers University, 136 Frelinghuysen Rd, Piscataway, New Jersey 08854, USA
3LPMMC, Université Joseph Fourier–CNRS, 25 Avenue des Martyrs, BP 166, 38042 Grenoble, France

A protocol to test cross correlations between charge and critical-current noise in the small superconducting contacts of an asymmetric Cooper-pair transistor coupled to a phase qubit is presented. The superconducting circuit behaves as a tunable four-level quantum system that can be prepared in two different configurations where cross-correlation terms are, respectively, absent or present and therefore, in principle, detectable. The measurements of the cross correlations are performed either through the escape probability of the dc superconducting quantum interference device or a quantum-state tomography of a few elements of the reduced density matrix of the four-level quantum system. ©2010 The American Physical Society
History: Received 22 October 2009; revised 29 December 2009; published 23 February 2010
Permalink: http://link.aps.org/abstract/PRB/v81/e052505
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