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Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−delta films of variable thickness

Source: J. Appl. Phys. 107, 043905 (2010); doi:10.1063/1.3259372

Published 19 February 2010

KEYWORDS and PACS
Keywords
PACS
  • 74.25.F-
    Transport properties
  • 74.78.-w
    Superconducting films and low-dimensional structures
  • 74.72.-h
    Cuprate superconductors
  • YEAR: 2010
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Jonathan R. Dizon, Xiang Wang, and Judy Z. Wu
Department of Physics and Astronomy, University of Kansas, Lawrence, Kansas 66045, USA
An improved near-field scanning microwave microscope (NSMM) combined with electrical transport measurement was applied for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−delta (YBCO) films. We demonstrate identification of the current-obstructing defects in thin (thickness below 300  nm) YBCO films by mapping microwave-induced electrical voltage (DeltaV) and reflected microwave power on the sample. In addition, the technique was also found to be suitable for characterizing electrical dissipation in thick YBCO films of a few micrometer thick. In order to improve the spatial resolution to submicron regime, we have employed a hybrid probe tip with a submicron tip diameter and operate the NSMM to its second harmonic frequency to increase hot spot microwave absorption. A much improved spatial resolution in the submicrometer range for the microwave maps was achieved while maintaining the sensitivity in the DeltaV measurement. ©2010 American Institute of Physics
History: Received 13 January 2009; accepted 5 October 2009; published 19 February 2010
Permalink: http://link.aip.org/link/?JAPIAU/107/043905/1

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