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Electrically detected magnetic resonance using radio-frequency reflectometry

Source: Rev. Sci. Instrum. 80, 114705 (2009); doi:10.1063/1.3258206

Published 11 November 2009

KEYWORDS and PACS
Keywords
PACS
  • 07.57.Pt
    Submillimeter wave, microwave and radiowave spectrometers
  • YEAR: 2010
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H. Huebl, R. P. Starrett, D. R. McCamey, A. J. Ferguson, and L. H. Willems van Beveren
Australian Research Council Centre of Excellence for Quantum Computer Technology, School of Physics, The University of New South Wales, Sydney 2052, Australia
The authors demonstrate readout of electrically detected magnetic resonance at radio frequencies by means of a LCR tank circuit. Applied to a silicon field-effect transistor at millikelvin temperatures, this method shows a 25-fold increased signal-to-noise ratio of the conduction band electron spin resonance and a higher operational bandwidth of >300  kHz compared to the kilohertz bandwidth of conventional readout techniques. This increase in temporal resolution provides a method for future direct observations of spin dynamics in the electrical device characteristics. ©2009 American Institute of Physics
History: Received 30 September 2009; accepted 13 October 2009; published 11 November 2009
Permalink: http://link.aip.org/link/?RSINAK/80/114705/1

REFERENCES (21)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. J. -M. Spaeth and H. Overhof, Point Defects in Semiconductors and Insulators (Springer, Berlin, 2003).
  2. A. Schweiger and G. Jeschke, Principles of Pulse Electron Paramagnetic Resonance (Oxford University Press, New York, 2001).
  3. D. C. Maier, Bruker Rep. 144, 13 (1997).
  4. D. R. McCamey, H. Huebl, M. S. Brandt, W. D. Hutchison, J. C. McCallum, R. G. Clark, and A. R. Hamilton, Appl. Phys. Lett. 89, 182115 (2006).
  5. L. Childress, M. V. Gurudev Dutt, J. M. Taylor, A. S. Zibrov, F. Jelezko, J. Wrachtrup, P. R. Hemmer, and M. D. Lukin, Science 314, 281 (2006).
  6. F. H. L. Koppens, C. Buizert, K. J. Tielrooij, I. T. Vink, K. C. Nowack, T. Meunier, L. P. Kouwenhoven, and L. M. K. Vandersypen, Nature (London) 442, 766 (2006).
  7. J. Wrachtrup, C. von Borczyskowski, J. Bernard, M. Orritt, and R. Brown, Nature (London) 363, 244 (1993).
  8. J. Köhler, J. A. J. M. Disselhorst, M. C. J. M. Donckers, E. J. J. Groenen, J. Schmidt, and W. E. Moerner, Nature (London) 363, 242 (1993).
  9. A. R. Stegner, C. Boehme, H. Huebl, M. Stutzmann, K. Lips, and M. S. Brandt, Nat. Phys. 2, 835 (2006).
  10. H. Huebl, F. Hoehne, B. Grolik, A. R. Stegner, M. Stutzmann, and M. S. Brandt, Phys. Rev. Lett. 100, 177602 (2008).
  11. R. J. Schoelkopf, P. Wahlgren, A. A. Kozhevnikov, P. Delsing, and D. E. Prober, Science 280, 1238 (1998).
  12. V. Eremin, D. S. Poloskin, E. Verbitskaya, M. P. Vlasenko, L. S. Vlasenko, R. Laiho, and T. O. Niinikoski, J. Appl. Phys. 93, 9659 (2003).
  13. C. F. O. Graeff, M. S. Brandt, M. Stutzmann, M. Holzmann, G. Abstreiter, and F. Schäffler, Phys. Rev. B 59, 13242 (1999).
  14. M. Stutzmann, M. S. Brandt, and M. W. Bayerl, J. Non-Cryst. Solids 266, 1 (2000).
  15. L. H. Willems van Beveren, H. Huebl, D. R. McCamey, T. Duty, A. J. Ferguson, R. G. Clark, and M. S. Brandt, Appl. Phys. Lett. 93, 072102 (2008).
  16. R. N. Ghosh and R. H. Silsbee, Phys. Rev. B 46, 12508 (1992).
  17. C. F. Young, E. H. Poindexter, G. J. Gerardi, W. L. Warren, and D. J. Keeble, Phys. Rev. B 55, 16245 (1997).
  18. P. R. Cullis and J. R. Marko, Phys. Rev. B 11, 4184 (1975).
  19. G. W. Morley, D. R. McCamey, H. A. Seipel, L. -C. Brunel, J. van Tol, and C. Boehme, Phys. Rev. Lett. 101, 207602 (2008).
  20. R. Sarpeshkar, T. Delbrück, and C. Mead, IEEE Circuits Devices Mag. 9, 23 (1993).
  21. M. S. Brandt, R. T. Neuberger, and M. Stutzmann, Appl. Phys. Lett. 76, 1467 (2000).

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