Electrical preparation and readout of a single spin state in a quantum dot via spin bias
Source: Phys. Rev. B 81, 075310 (2010); doi:10.1103/PhysRevB.81.075310
Published 9 February 2010
Based on the device in recent experiments [S. M. Frolov et al., Phys. Rev. Lett. 102, 116802 (2009); Nature (London) 458, 868 (2009)], we propose an all-electrical scheme to prepare and readout a single spin state in a quantum dot (QD). We consider that the QD, which is subjected to a spin bias, has a single spin-degenerate energy level
d in the presence of Coulomb interaction U. By tuning the energy level controlled experimentally by a gate voltage, write in and read out the spin information can be achieved in the following way. When the level
d is within the spin bias window, a spin state can be written into the dot even for very weak spin bias. When both
d and
d+U are tuned to be out of the spin bias window, the initialized spin state can be preserved on the dot for a very long time (e.g., on the order of second), during which many qubit manipulations can be accomplished. Finally, by tuning the level
d+U to the spin bias window, the spin state can be read out by measuring the charge current.
©2010 The American Physical Society
d in the presence of Coulomb interaction U. By tuning the energy level controlled experimentally by a gate voltage, write in and read out the spin information can be achieved in the following way. When the level
d is within the spin bias window, a spin state can be written into the dot even for very weak spin bias. When both
d and
d+U are tuned to be out of the spin bias window, the initialized spin state can be preserved on the dot for a very long time (e.g., on the order of second), during which many qubit manipulations can be accomplished. Finally, by tuning the level
d+U to the spin bias window, the spin state can be read out by measuring the charge current.
©2010 The American Physical Society
| History: | Received 15 October 2009; revised 27 November 2009; published 9 February 2010 |
| Permalink: |
http://link.aps.org/abstract/PRB/v81/e075310 |
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