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Development of a nonlinear nanoprobe for interferometric autocorrelation based characterization of ultrashort optical pulses

Source: Appl. Phys. Lett. 96, 021103 (2010); doi:10.1063/1.3276081

Published 11 January 2010

KEYWORDS and PACS
Keywords
PACS
  • 07.79.-v
    Scanning probe microscopes and components
  • 42.65.Re
    Ultrafast processes; optical pulse generation and pulse compression
  • 07.60.Ly
    Optical interferometers
  • 42.70.Nq
    Other nonlinear optical materials; photorefractive and semiconductor materials
  • 81.07.Gf
    Nanowires
  • 81.07.Oj
    Nanoelectromechanical systems (NEMS)
  • YEAR: 2010
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PUBLICATION DATA
ISSN:
1553-9601 (online)
Publisher:
AIP is a member of CrossRef AIP
Haifeng Li,1 Yaoshun Jia,2 Qian Xu,1 Kebin Shi,1 Jian Wu,3 Peter C. Eklund,3,4 Yong Xu,2 and Zhiwen Liu1
1Department of Electrical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
2Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA
3Departments of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
4Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA

Near-field scanning can achieve nanoscale resolution while ultrashort pulse diagnostic tools can characterize femtosecond pulses. Yet currently it is still challenging to nonperturbatively characterize the near field of an ultrashort optical pulse with nanofemtoscale spatiotemporal resolution. To address this challenge, we propose to develop a nonlinear nanoprobe composed of a silica fiber taper, a nanowire, and nonlinear fluorescent spheres. Using such a nanoprobe, we also report proof-of-principle characterization of femtosecond optical pulse through interferometric autocorrelation measurement. ©2010 American Institute of Physics
History: Received 7 August 2009; accepted 7 November 2009; published 11 January 2010
Permalink: http://link.aip.org/link/?APPLAB/96/021103/1

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