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Observation of nonequilibrium carrier distribution in Ge, Si, and GaAs by terahertz pump–terahertz probe measurements

Source: Phys. Rev. B 81, 035201 (2010); doi:10.1103/PhysRevB.81.035201

Published 4 January 2010

PACS
  • 78.47.J-
    Ultrafast pump/probe spectroscopy (<1 ps) in condensed matter
  • 71.55.Cn
    Impurity and defect levels in elemental semiconductors
  • 72.20.Ht
    High-field transport and nonlinear effects (semiconductors/insulators)
  • YEAR: 2010
PUBLICATION DATA
ISSN:
1553-9601 (online)
Publisher:
AIP is a member of CrossRef APS
János Hebling,1,2 Matthias C. Hoffmann,1,3 Harold Y. Hwang,1 Ka-Lo Yeh,1 and Keith A. Nelson1
1Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
2Department of Experimental Physics, University of Pécs, 7624 Pécs, Hungary
3Max Planck Group for Structural Dynamics, University of Hamburg, CFEL, Hamburg, Germany

We compare the observed strong saturation of the free-carrier absorption in n-type semiconductors at 300 K in the terahertz (THz) frequency range when single-cycle pulses with intensities up to 150  MW/cm2 are used. In the case of germanium, a small increase in the absorption occurs at intermediate THz pulse energies. The recovery of the free-carrier absorption was monitored by time-resolved THz pump–THz probe measurements. At short probe delay times, the frequency response of germanium cannot be fitted by the Drude model. We attribute these unique phenomena of Ge to dynamical overpopulation of the high mobility Gamma conduction-band valley. ©2010 The American Physical Society
History: Received 8 July 2009; revised 7 October 2009; published 4 January 2010
Permalink: http://link.aps.org/abstract/PRB/v81/e035201
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