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Plasma characterization using terahertz-wave-enhanced fluorescence

Source: Appl. Phys. Lett. 96, 041505 (2010); doi:10.1063/1.3291676

Published 29 January 2010

KEYWORDS and PACS
Keywords
PACS
  • 52.25.Os
    Emission, absorption, and scattering of electromagnetic radiation from plasmas
  • 52.50.Jm
    Plasma production and heating by laser beams
  • 52.20.Fs
    Electron collisions in plasma
  • YEAR: 2010
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PUBLICATION DATA
ISSN:
1553-9601 (online)
Publisher:
AIP is a member of CrossRef AIP
Jingle Liu and X.-C. Zhang
Center for Terahertz Research, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
We demonstrate that the terahertz-wave-enhanced fluorescence emission from excited atoms or molecules can be employed in the characterization of laser-induced gas plasmas. The electron relaxation time and plasma density were deduced through applying the electron impact excitation/ionization and electron-ion recombination processes to the measured time-dependent enhanced fluorescence. The electron collision dynamics of nitrogen plasma excited at different gas pressures and laser pulse energies have been systematically investigated. This plasma characterization method provides picosecond temporal resolution and enables omnidirectional optical signal collection. ©2010 American Institute of Physics
History: Received 11 November 2009; accepted 21 December 2009; published 29 January 2010
Permalink: http://link.aip.org/link/?APPLAB/96/041505/1

REFERENCES (20)

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  1. Plasma Diagnostic Techniques, edited by R. H. Huddletsone and S. L. Leonard (Academic, New York, 1965).
  2. J. Hopwood, C. R. Guarnieri, S. J. Whitehair, and J. J. Cuomo, J. Vac. Sci. Technol. 11, 152 (1993).
  3. H. R. Griem, Plasma Spectroscopy (McGraw-Hill, New York, 1964).
  4. M. A. Heald and C. B. Wharton, Plasma Diagnostics with Microwaves (Wiley, New York, 1965).
  5. D. E. T. F. Ashby and D. F. Jephcott, Appl. Phys. Lett. 3, 13 (1963).
  6. J. L. Krause, K. J. Schafer, and K. C. Kulander, Phys. Rev. Lett. 68, 3535 (1992).
  7. J. Kasparian, M. Rodriguez, G. Méjean, J. Yu, E. Salmon, H. Wille, R. Bourayou, S. Frey, Y. -B. André, A. Mysyrowicz, R. Sauerbrey, J. -P. Wolf, and L. Wöste, Science 301, 61 (2003).
  8. H. Schillinger and R. Sauerbey, Appl. Phys. B: Lasers Opt. 68, 753 (1999).
  9. S. Tzortzakis, B. Prade, M. Franco, and A. Mysyrowicz, Opt. Commun. 181, 123 (2000).
  10. F. Théberge, W. Liu, P. Simard, A. Becker, and S. L. Chin, Phys. Rev. E 74, 036406 (2006).
  11. S. P. Jamison, J. Shen, D. R. Jones, R. C. Issac, B. Ersfeld, D. Clark, and D. A. Jaroszynski, J. Appl. Phys. 93, 4334 (2003).
  12. B. H. Kolner, P. M. Conklin, R. A. Buckles, N. K. Fontaine, and R. P. Scott, Appl. Phys. Lett. 87, 151501 (2005).
  13. Z. Mics, F. Kadlec, P. Kuzel, P. Jungwirth, S. E. Bradforth, and V. Apkarian, J. Chem. Phys. 123, 104310 (2005).
  14. J. Liu and X. -C. Zhang, Phys. Rev. Lett. 103, 235002 (2009).
  15. Q. Wu, M. Litz, and X. -C. Zhang, Appl. Phys. Lett. 68, 2924 (1996).
  16. R. W. Crompton, M. T. Elford, and A. G. Robertson, Aust. J. Phys. 23, 667 (1970).
  17. Y. Itikawa, J. Phys. Chem. Ref. Data 35, 31 (2006).
  18. M. Mlejnek, E. M. Wright, and J. V. Moloney, Phys. Rev. E 58, 4903 (1998).
  19. B. B. Bryan, R. B. Holt, and O. Oldenberg, Phys. Rev. 106, 83 (1957).
  20. M. V. Ammosov, N. B. Delone, and V. P. Krainov, Sov. Phys. JETP 64, 1191 (1986).

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