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Nanograting-based compact vacuum ultraviolet spectrometer and beam profiler for in situ characterization of high-order harmonic generation light sources

Source: Rev. Sci. Instrum. 81, 063109 (2010); doi:10.1063/1.3443575

Published 21 June 2010

EPAPS
KEYWORDS and PACS
Keywords
PACS
  • 07.60.Rd
    Visible and ultraviolet spectrometers
  • 42.79.Dj
    Gratings
  • 42.65.Re
    Ultrafast processes; optical pulse generation and pulse compression
  • 06.60.Jn
    High-speed laboratory techniques (microsecond to femtosecond)
  • 42.65.Ky
    Optical frequency conversion; harmonic generation
  • YEAR: 2010
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PUBLICATION DATA
ISSN:
1553-9601 (online)
Publisher:
AIP is a member of CrossRef AIP
Oleg Kornilov,1 Russell Wilcox,2 and Oliver Gessner1
1Ultrafast X-Ray Science Laboratory, Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
2Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
A compact, versatile device for vacuum ultraviolet (VUV) beam characterization is presented. It combines the functionalities of a VUV spectrometer and a VUV beam profiler in one unit and is entirely supported by a standard DN200 CF flange. The spectrometer employs a silicon nitride transmission nanograting in combination with a microchannel plate-based imaging detector. This enables the simultaneous recording of wavelengths ranging from 10 to 80 nm with a resolution of 0.25–0.13 nm. Spatial beam profiles with diameters up to 10 mm are imaged with 0.1 mm resolution. The setup is equipped with an in-vacuum translation stage that allows for in situ switching between the spectrometer and beam profiler modes and for moving the setup out of the beam. The simple, robust design of the device is well suited for nonintrusive routine characterization of emerging laboratory- and accelerator-based VUV light sources. Operation of the device is demonstrated by characterizing the output of a femtosecond high-order harmonic generation light source. ©2010 American Institute of Physics
History: Received 8 April 2010; accepted 13 May 2010; published 21 June 2010
Permalink: http://link.aip.org/link/?RSINAK/81/063109/1

REFERENCES (37)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. T. Pfeifer, C. Spielmann, and G. Gerber, Rep. Prog. Phys. 69, 443 (2006).
  2. T. Brabec and F. Krausz, Rev. Mod. Phys. 72, 545 (2000).
  3. M. Drescher, M. Hentschel, R. Kienberger, M. Uiberacker, V. Yakovlev, A. Scrinzi, Th. Westerwalbesloh, U. Kleineberg, U. Heinzmann, and F. Krausz, Nature (London) 419, 803 (2002).
  4. L. Nugent-Glandorf, M. Scheer, D. A. Samuels, A. M. Mulhisen, E. R. Grant, X. Yang, V. M. Bierbaum, and S. R. Leone, Phys. Rev. Lett. 87, 193002 (2001).
  5. E. Gagnon, P. Ranitovic, X. -M. Tong, C. L. Cocke, M. M. Murnane, H. C. Kapteyn, and A. S. Sandhu, Science 317, 1374 (2007).
  6. A. L. Cavalieri, N. Müller, Th. Uphues, V. S. Yakovlev, A. Baltuška, B. Horvath, B. Schmidt, L. Blümel, R. Holzwarth, S. Hendel, M. Drescher, U. Kleineberg, P. M. Echenique, R. Kienberger, F. Krausz, and U. Heinzmann, Nature (London) 449, 1029 (2007).
  7. Z. H. Loh, M. Khalil, R. E. Correa, R. Santra, C. Buth, and S. R. Leone, Phys. Rev. Lett. 98, 143601 (2007).
  8. M. Uiberacker, Th. Uphues, M. Schultze, A. J. Verhoef, V. Yakovlev, M. F. Kling, J. Rauschenberger, N. M. Kabachnik, H. Schröder, M. Lezius, K. L. Kompa, H. -G. Muller, M. J. J. Vrakking, S. Hendel, U. Kleineberg, U. Heinzmann, M. Drescher, and F. Krausz, Nature (London) 446, 627 (2007).
  9. L. Poletto, S. Bonora, M. Pascolini, and P. Villoresi, Rev. Sci. Instrum. 75, 4413 (2004).
  10. L. Poletto, P. Villoresi, F. Frassetto, F. Calegari, F. Ferrari, M. Lucchini, G. Sansone, and M. Nisoli, Rev. Sci. Instrum. 80, 123109 (2009).
  11. C. D. Liu, Y. Zheng, Z. Zeng, P. Liu, R. Li, and Z. Xu, Opt. Express 17, 10319 (2009).
  12. T. A. Savas, S. N. Shah, M. L. Schattenburg, J. M. Carter, and H. I. Smith, J. Vac. Sci. Technol. B 13, 2732 (1995).
  13. T. A. Savas, M. L. Schattenburg, J. M. Carter, and H. I. Smith, J. Vac. Sci. Technol. B 14, 4167 (1996).
  14. O. Kornilov, C. C. Wang, O. Bnermann, A. T. Healy, M. Leonard, C. Peng, S. R. Leone, D. M. Neumark, and O. Gessner, J. Phys. Chem. A 114, 1437 (2010).
  15. E. Takahashi, Y. Nabekawa, T. Otsuka, M. Obara, and K. Midorikawa, Phys. Rev. A 66, 021802 (2002).
  16. J. L. Krause, K. J. Schafer, and K. C. Kulander, Phys. Rev. Lett. 68, 3535 (1992).
  17. P. B. Corkum, Phys. Rev. Lett. 71, 1994 (1993).
  18. P. Salières, A. L'Huillier, and M. Lewenstein, Phys. Rev. Lett. 74, 3776 (1995).
  19. T. Wilhein, S. Rehbein, D. Hambach, M. Berglund, L. Ryrnell, and H. M. Hertz, Rev. Sci. Instrum. 70, 1694 (1999).
  20. See supplementary material at http://dx.doi.org/10.1063/1.3443575 for computer programs (GNU OCTAVE) used for calibration and generation of the VUV spectra. [EPAPS]
  21. J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, and O. Siegmund, Nucl. Instrum. Methods Phys. Res. A 386, 280 (1997).
  22. B. L. Henke, E. M. Gullikson, and J. C. Davis, Atom. Data Nucl. Data Tables 54, 181 (1993).
  23. O. Siegmund, J. Vallerga, and A. Tremsin, Proc. SPIE 5898, 58980H (2005).
  24. R. Hemphill, J. Edelstein, and D. Rogers, Appl. Opt. 36, 1421 (1997).
  25. O. H. W. Siegmund, E. Everman, J. V. Vallerga, J. Sokolowski, and M. Lampton, Appl. Opt. 26, 3607 (1987).
  26. G. W. Fraser, Nucl. Instrum. Methods Phys. Res. 195, 523 (1982).
  27. O. L. Landen, A. Lobban, T. Tutt, P. M. Bell, R. Costa, D. R. Hargrove, and F. Ze, Rev. Sci. Instrum. 72, 709 (2001).
  28. G. A. Rochau, J. E. Bailey, G. A. Chandler, T. J. Nash, D. S. Nielsen, G. S. Dunham, O. F. Garcia, N. R. Joseph, J. W. Keister, M. J. Madlener, D. V. Morgan, K. J. Moy, and M. Wu, Rev. Sci. Instrum. 77, 10E323 (2006).
  29. P. Salieres, B. Carré, L. Le Déroff, F. Grasbon, G. G. Paulus, H. Walther, R. Kopold, W. Becker, D. B. Milošević, A. Sanpera, and M. Lewenstein, Science 292, 902 (2001).
  30. H. T. Kim, I. J. Kim, K. -H. Hong, D. G. Lee, J. -H. Kim, and C. H. Nam, J. Phys. B 37, 1141 (2004).
  31. E. Hecht, Optics, 4th ed. (Addison Wesley, Reading, 2001).
  32. M. Born and E. Wolf, Principles of Optics (Cambridge University Press, Cambridge, 1998).
  33. G. Vdovin, H. van Brug, and F. van Goor, Proc. SPIE 3190, 82 (1997).
  34. J. Zhou, J. Peatross, M. M. Murnane, and H. C. Kapteyn, Phys. Rev. Lett. 76, 752 (1996).
  35. J. J. Carrera and S. I. Chu, Phys. Rev. A 75, 033807 (2007).
  36. Z. Chang, A. Rundquist, H. Wang, I. Christov, H. C. Kapteyn, and M. M. Murnane, Phys. Rev. A 58, R30 (1998).
  37. D. G. Lee, J. H. Kim, K. H. Hong, and C. H. Nam, Phys. Rev. Lett. 87, 243902 (2001).

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