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Tunable ultrafast extreme ultraviolet source for time- and angle-resolved photoemission spectroscopy

Source: Rev. Sci. Instrum. 81, 073108 (2010); doi:10.1063/1.3460267

Published 20 July 2010

KEYWORDS and PACS
Keywords
PACS
  • 07.81.+a
    Electron and ion spectrometers
  • 42.65.Ky
    Optical frequency conversion; harmonic generation
  • 79.60.Bm
    Photoelectron spectra of clean metal, semiconductor, and insulator surfaces
  • YEAR: 2010
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PUBLICATION DATA
ISSN:
1553-9601 (online)
Publisher:
AIP is a member of CrossRef AIP
G. L. Dakovski,1 Y. Li,2 T. Durakiewicz,2 and G. Rodriguez1
1MPA-CINT, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
2MPA-CMMS, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
We present a laser-based apparatus suitable for visible pump/extreme UV (XUV) probe time-, energy-, and angle-resolved photoemission spectroscopy utilizing high-harmonic generation from a noble gas. Tunability in a wide range of energies (currently 20–36 eV) is achieved by using a time-delay compensated monochromator, which also preserves the ultrashort duration of the XUV pulses. Using an amplified laser system at 10 kHz repetition rate, approximately 109–1010  photons/s per harmonic are made available for photoelectron spectroscopy. Parallel energy and momentum detection is carried out in a hemispherical electron analyzer coupled with an imaging detector. First applications demonstrate the capabilities of the instrument to easily select the probe wavelength of choice, to obtain angle-resolved photoemission maps (GaAs and URu2Si2), and to trace ultrafast electron dynamics in an optically excited semiconductor (Ge). ©2010 American Institute of Physics
History: Received 6 May 2010; accepted 14 June 2010; published 20 July 2010
Permalink: http://link.aip.org/link/?RSINAK/81/073108/1

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