Virt. J. Ultrafast Sci. / Volume 11 / Issue 1 / ULTRAFAST METHODS AND MEASUREMENT TECHNIQUES

Wavefront retrieval of amplified femtosecond beams by second-harmonic generation

Source: Opt. Express 19, 22851 (2012); http://dx.doi.org/10.1364/OE.19.022851

Issue Date: January 2012

ABSTRACT

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PUBLICATION DATA

ISSN:

1553-9601 (online)

Publisher:

OSA

Rocío Borrego-Varillas, Carolina Romero, Javier R. Vázquez de Aldana, Juan M. Bueno, and Luis Roso

Wepresent a new approach for wavefront characterization of near transform-limitedintense femtosecond beams using the angular and spectral dependences ofthe second-harmonic generation conversion efficiency in uniaxial crystals. The methodis applied to different aberrated beams and results are comparedwith the measurements performed with a commercial sensor, finding verygood agreement. The phase retrieval dependence with different parameters (e.g.crystal thickness) is discussed. Successful application to sharpen intensity profilesis also demonstrated. ©2011 Optical Society of America

(As supplied by publisher.)

Digital Object Identifier:

http://dx.doi.org/10.1364/OE.19.022851

Ultrahigh 22 nm resolution coherent diffractive imaging using a desktop 13 nm high harmonic source

Frequency stability of a femtosecond optical parametric oscillator frequency comb

Wavefront retrieval of amplified femtosecond beams by second-harmonic generation

Source: Opt. Express 19, 22851 (2012); http://dx.doi.org/10.1364/OE.19.022851