Applied Physics Letters, Vol. 72, No. 19, pp. 2466-2468, 11 May 1998
© 1998 American Institute of Physics. All rights reserved.
xO as a II
VI widegap semiconductor alloy
VI semiconductor alloy, MgxZn1
xO, for the fabrication of heteroepitaxial ultraviolet light emitting devices based on ZnO. The c-axis oriented MgxZn1
xO films were epitaxially grown by pulsed laser deposition on ZnO epitaxial films and sapphire (0001) substrates using ceramic targets. Solid solution films were prepared with Mg content up to x = 0.33, achieving a band gap of 3.99 eV at room temperature. MgO impurity phase segregated at x
0.36. Lattice constants of MgxZn1
xO films changed slightly ( ~ 1%), increasing in a axis and decreasing in c-axis direction with increasing x. These films showed ultraviolet photoluminescence at energies from 3.36 (x = 0) to 3.87 eV (x = 0.33) at 4.2 K. © 1998 American Institute of Physics. [S0003-6951(98)04219-3]