Applied Physics Letters, 3 January 2005
Appl. Phys. Lett. 86, 014101 (2005) (3 pages)
©2005 American Institute of Physics. All rights reserved.
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Atomic force microscopy with time resolution of microseconds
M. Anwar
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 and School of Medicine, University of California, San Francisco, San Francisco, California 94143
I. Rousso(a)
BioImaging Center, Whitehead Institute/Massachusetts Institute of Technology, Cambridge, Massachusetts 02142 and Department of Structural Biology, Weizmann Institute of Science, Rehovot 76100, Israel
(Received: 12 August 2004; accepted: 1 November 2004; published online: 23 December 2004)The atomic force microscope (AFM) can acquire high-resolution images under nondestructive conditions albeit at a very poor temporal resolution. This work presents two AFM mapping techniques, stroboscopic, and continuous, for imaging rapid periodical processes with nanometer spatial resolution and microsecond time resolution. Application of these methods is demonstrated for imaging very rapid cyclic changes in the position of a microfabricated grid. Motion was resolved with 10 nm spatial resolution, and 5 and 25 µs temporal resolution using the stroboscopic and continuous mode, respectively. The proposed methods have the potential to image wide variety of rapid processes with unparalleled combination of lateral and temporal resolutions. ©2005 American Institute of Physics
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