Applied Physics Letters, 3 January 2005
Appl. Phys. Lett. 86, 014101 (2005) (3 pages)
©2005 American Institute of Physics. All rights reserved.
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FIGURES


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Fig. 1. (Color online) A representative frame from the time-lapse movie of the sample motion measured with the stroboscopic time-resolved AFM method. The image is reconstructed from 484  pixels (22×22) which are 10  nm apart. Overall the image covers an area of 220×220  nm2. For the time-lapse movie, see EPAPS. Ref. 7. First citation in article


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Fig. 2. (Color online) Four seconds representative sample of the data stream recorded in the continuous mode. (a) and (b) show the voltages corresponding to the x and y position of the cantilever, respectively. Each voltage step corresponds to 10  nm, and location on the grid can be determined from the voltage levels of the A and B traces. The z-piezo and PSD signal are shown in (c) and (d), respectively. All four channels of time-stamped data are streamed continuously and stored, as the cantilever moves over a virtual grid overlaying the sample. At each transition (marked by arrows), the entire data stream is cut and each segment of data corresponds to the motion of a particular point on the sample. The z-piezo signal contains slow motions and the dc characteristics of the sample, while the PSD shows the rapid motions. First citation in article


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Fig. 3. (Color online) The motion traces of all pixels plotted in contour maps. Two cycles of motion, spanning 2  ms are shown. (a) Traces before phase alignment; (b) traces after the course alignment process. A phase error that is linear with acquisition time remains. The maximum phase error occurs at the last pixel and is 5.5%; (c) traces after application of the frame matching algorithm during the refinement process. The phase error is largely eliminated and the remaining error has a rms value of 0.19%. First citation in article


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