Applied Physics Letters, 3 January 2005
Appl. Phys. Lett. 86, 014102 (2005) (3 pages)
©2005 American Institute of Physics. All rights reserved.
Next section | Up: Issue Table of Contents
Go to: Previous Article | Next Article
Other formats: HTML (all one file, 32 kB + graphics) | PDF (130 kB)
X-ray high-resolution diffraction using refractive lenses
Michael Drakopoulos
Diamond Light Source Ltd., Chilton, Oxfordshire OX11 0QX, United Kingdom
Anatoly Snigirev and Irina Snigireva
European Synchrotron Radiation Facility, 38043 Grenoble, France
Jörg Schilling
California Institute of Technology, Pasadena, California 91125
(Received: 21 July 2004; accepted: 1 November 2004; published online: 23 December 2004)Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 µm periodicity, which normally is employed to scatter light in the infrared. ©2005 American Institute of Physics
Contents
Next section | Up: Issue Table of Contents
Go to: Previous Article | Next Article
Other formats: HTML (all one file, 32 kB + graphics) | PDF (130 kB)