Applied Physics Letters, 7 January 2008
Appl. Phys. Lett. 92, 013302 (2008) (3 pages)
©2008 American Institute of Physics. All rights reserved. 
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Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy
B. J. Leever and M. F. Durstock
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright Patterson AFB, Ohio 45433, USA
M. D. Irwin, A. W. Hains, and T. J. Marks(a)
Department of Chemistry, Northwestern University, Evanston, Illinois 60208-3113, USA
L. S. C. Pingree and M. C. Hersam(b)
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208-3108, USA
(Received: 4 October 2007; accepted: 10 December 2007; published online: 4 January 2008)A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 µm2 poly(3-hexylthiophene):[6,6]-phenyl-C61-butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices. ©2008 American Institute of Physics
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