Applied Physics Letters, 12 May 2008
Appl. Phys. Lett. 92, 192502 (2008) (3 pages)
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FIGURES


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Fig. 1. (Color) Electrical, magnetic, and structural dependence on As:Ga for a 100  nm thick Ga0.84Mn0.16As film grown without rotation. Inset: substrate and source geometry. (a) Room temperature longitudinal (sigmaxx) and Hall (sigmaxy) conductivities, (b) Curie temperature (TC) and saturation moment (Msat) at 5  K, and (c) lattice constant (aGaMnAs) for different As:Ga. Stoichiometric region is shaded gray. Inset: sigmaxx vs anneal time, right axis is the anneal temperature. (d) HRXRD scans along omega-2theta near the (004) substrate peak measured on stoichiometric (as-grown and annealed) and As-rich samples labeled in the figure. First citation in article


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Fig. 2. (Color) Variation in ferromagnetism and magnetotransport due to stoichiometry and postgrowth annealing for a 100  nm thick Ga0.84Mn0.16As film grown without rotation. (a) Magnetic moment (M) and sigmaxx vs temperature (T). (b) M vs magnetic field (H) hysteresis loops from the stoichiometric, annealed sample at various temperatures near TC. (c) Hysteresis loops at 5  K. (d) Resistivity (rhoxx) at 10  K vs H. MR at 14  T is labeled in the figure. Hall resistivity (rhoxy) vs H for the annealed, stoichiometric sample. First citation in article


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Fig. 3. (Color) (a) TC vs x for stoichiometric samples of Ga1−xMnxAs for 0<x<0.22 from many separate nonrotated growth runs. Data are shown both for as-grown and optimally annealed samples. Lines are guides to the eye. (b) Lattice constant (aGaMnAs) vs x from HRXRD scans as shown in Fig. 1(d). Using the model proposed by Masek et al. (Ref. 17), linear fits to our data indicate a constant fraction of interstitials (z/x, labeled in the figure) for x<=0.16. The blue data are for increasingly As-rich material, along the arrow. First citation in article


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