Applied Physics Letters, 14 January 2008
Appl. Phys. Lett. 92, 026101 (2008) (2 pages)
©2008 American Institute of Physics. All rights reserved. 
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Comment on “Method to analyze electromechanical stability of dielectric elastomers” [Appl. Phys. Lett. 91, 061921 (2007)]
Andrew N. Norris(a)
Mechanical and Aerospace Engineering, Rutgers University, Piscataway, New Jersey 08854, USA
(Received: 18 September 2007; accepted: 17 December 2007; published online: 14 January 2008)The model of Zhao and Suo can be readily generalized to predict the critical breakdown electric field Ec of elastomers with arbitrary elastic strain energy function. An explicit expression for Ec is presented for elastomeric thin films under biaxial strain and comparisons are made with experimental data using a two term Ogden rubber elasticity model. Simplified results for uniaxial and for equibiaxial stress provide further insight into the electromechanical stability model. ©2008 American Institute of Physics
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