Journal of Applied Physics, 15 March 2008
J. Appl. Phys. 103, 061301 (2008) (26 pages)
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APPLIED PHYSICS REVIEWS

Surface characterization and functionalization of carbon nanofibers

K. L. Klein,1,2 A. V. Melechko,2,3 T. E. McKnight,4 S. T. Retterer,2,5 P. D. Rack,1,2 J. D. Fowlkes,2 D. C. Joy,1,2 and M. L. Simpson1,2 *

1Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
2Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
3Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
4Engineering Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
5Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

(Received: 12 November 2007; accepted: 10 December 2007; published online: 17 March 2008)

Carbon nanofibers are high-aspect ratio graphitic materials that have been investigated for numerous applications due to their unique physical properties such as high strength, low density, metallic conductivity, tunable morphology, chemical and environmental stabilities, as well as compatibility with organochemical modification. Surface studies are extremely important for nanomaterials because not only is the surface structurally and chemically quite different from the bulk, but its properties tend to dominate at the nanoscale due to the drastically increased surface-to-volume ratio. This review surveys recent developments in surface analysis techniques used to characterize the surface structure and chemistry of carbon nanofibers and related carbon materials. These techniques include scanning probe microscopy, infrared and electron spectroscopies, electron microscopy, ion spectrometry, temperature-programed desorption, and atom probe analysis. In addition, this article evaluates the methods used to modify the surface of carbon nanofibers in order to enhance their functionality to perform across an exceedingly diverse application space. ©2008 American Institute of Physics


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