Journal of Applied Physics, 15 November 2008
J. Appl. Phys. 104, 103109 (2008) (5 pages)
©2008 American Institute of Physics. All rights reserved. 
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Subwavelength imaging based on frequency scanning
Stanislav Maslovski,1 *Pekka Alitalo,2 and Sergei Tretyakov2
1Radiophysics Department, St. Petersburg State Polytechnical University, Polytechnicheskaya 29, 195251 St. Petersburg, Russia
2Department of Radio Science and Engineering, Helsinki University of Technology, P.O. Box 3000, FI-02015 TKK, Finland
(Received: 28 June 2008; accepted: 29 September 2008; published online: 19 November 2008)A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized resonant particles with a frequency scan over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field at one or at most two points. After the scan the distribution of the near field can be reconstructed with simple postprocessing. The proposed near-field microscope has no moving parts. ©2008 American Institute of Physics
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