Stress Induced Phenomena in Metallization: 4th International Workshop

4th international Workshop on Stress Induced Phenomena in Metallization

Hidekazu Okabayashi, NEC Corporation, Tsukuba, Ibaraki, JAPAN ; Paul S. Ho, The University of Texas at Austin, Interconnect and Packaging Group, Austin, TX, USA ; Shoso Shingubara, Hiroshima University, Dept. Elec. Engineering, Higashi-hiroshima, JAPAN

Conference Location and Date: Tokyo, Japan, 4-6 June 1997

Published ; ISBN 1-56396-682-4, One Volume, Print; 0 pages; $135.00

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