ELECTRON BEAM ION SOURCES AND TRAPS AND THEIR APPLICATIONS: 8th International Symposium

8th International Symposium on Electron Beam Ion Sources and Their Applications

Krsto Prelec, Brookhaven National Laboratory, Upton, NY, USA

Conference Location and Date: Upton, New York, 5-8 November 2000

Subseries: Accelerators and Beams

Published July 2001; ISBN 0-7354-0011-3, One Volume, Print; 318 pages; 6 3/8 x 9 1/4 inches; Hardcover; $140.00

Readership: Universities and research institutions with programs in atomic physics; institutions using accelerators.

This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.

Related AIP Titles: