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TEMPERATURE: Its Measurement and Control in Science and Industry; Volume Seven
Eighth International Temperature Symposium
Dean C. Ripple, National Institute of Standards and Technology, Gaithersburg, MD, USA
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AIP Conference Proceedings 684
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Conference Location and Date: Chicago, Illinois, 21-24 October 2002
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Subseries: None
Published November 2003; ISBN 0-7354-0153-5, Two Volume, Print; 1194 pages; 8.5 X 11 inches, double column; Hardcover; $295.00
Readership: metrologists; engineers and scientists in industrial process control, including metal, semiconductor, and chemical processing; manufacturers of instrumentation; physicists and chemists involved in thermophysical phenomena
All papers in this volume were peer reviewed by two reviewers for each paper. This volume describes recent developments in thermometry, process control, and related materials properties. Topics covered include: temperature standards; characterization and development of both common and novel thermometer types; uncertainties and calibration methods; results of recent international comparisons; hardware and methods for temperature control; and applications in the semiconductor and metal processing industries.
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