Print Version:  More Info 
You will be directed to Springer for print volume ordering
   Online Version: 



ION IMPLANTATION TECHNOLOGY: 16th International Conference on Ion Implantation Technology; IIT 2006

16th International Conference on Ion Implantation Technology

Karen J. Kirkby, Advanced Technology Institute, Surrey Ion Beam Centre, Guildford, Surrey, United Kingdom ; Russell M. Gwilliam, Advanced Technology Institute, Surrey Ion Beam Centre, Guildford, Surrey, United Kingdom ; Andy Smith, Advanced Technology Institute, Surrey Ion Beam Centre, Guildford, Surrey, United Kingdom ; David Chivers, Ion Links Int. Ltd., West Lothian, Scotland


AIP Conference Proceedings 866


Conference Location and Date: Marseille, France, 11-16 June 2006


Subseries: Accelerators and Beams

Published November 2006; ISBN 978-0-7354-0365-9, One Volume, Print; 682 pages; 8.5 X 11 inches, double column; Hardcover; $217.00
CD-ROM VERSION (sold separately): ISBN 978-0-7354-0366-6; $145.00
ISBN: 978-0-7354-0366-6, CD-ROM (sold separately) 145

Readership: Researchers in ion implantation technology (industry and academia); developers of ion implantation technology (industry); semiconductor chip manufacturers (industry); researchers in material modification by ion implantation (academia).

All papers were peer-reviewed. Ion implantation is used to manufacture semiconductor devices. Materials properties are changed by bombarding wafers with atoms, which are accelerated in an ion implanter. This is the premier world conference for the presentation of the latest advances in ion implantation, from the fundamentals of ion-solid interactions to manufacturing implant equipment. Topics included are: doping processes in semiconductors; plasma immersion ion implantation and plasma doping; materials - novel techniques and applications; implant technology; process control and yield; metrology; as well as machines.

Related AIP Titles:

CP# Editor(s) Title
1080Tokési / SulikRADIATION DAMAGE IN BIOMOLECULAR SYSTEMS: Proceedings of the 5th International Conference (RADAM 2008)
1066Seebauer, et al.ION IMPLANTATION TECHNOLOGY: 17th International Conference on Ion Implantation Technology
980Kponou, et al.POLARIZED ION SOURCES, TARGETS AND POLARIMETRY - PSTP2007: 12th International Workshop
931Seiler, et al.CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology
920Sheng / ZhangASIAN SUMMER SCHOOL ON LASER PLASMA ACCELERATION AND RADIATION:
788Seiler, et al.CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005:
749LeitnerELECTRON CYCLOTRON RESONANCE ION SOURCES: 16th International Workshop on ECR Ion Sources
680Duggan / MorganAPPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Seventeenth International Conference on the Application of Accelerators in Research and Industry
576Morgan / DugganAPPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Sixteenth International Conference

 

 

ADVERTISEMENT
Featured Jobs
University of Exeter
GBR - Devon
Chair and Lecturer (2 posts)

Sandia National Laboratories
US - NM - Albuquerque
Post Doc – Nuclear/ Nanoparticle Materials

Syracuse University
US - NY - Syracuse
Postdoc in Experimental CM Physics

University of Rochester
US - NY - Rochester
Biomedical Optics

More Jobs