RSI: Microscopy and Imaging http://scitation.aip.org/ RSI: Microscopy and Imaging Constant tip-surface distance with atomic force microscopy via quality factor feedback http://link.aip.org/link/?RSI/83/023706/1&agg=rss Lin Fan, Daniel Potter, and Todd Sulchek<br/> The atomic force microscope (AFM) is a powerful and widely used instrument to image topography and measure forces at the micrometer and nanometer length scale. Because of the high degree of operating accuracy required of the instrument, small thermal and mechanical drifts of the cantilever and piezo ... [Rev. Sci. Instrum. 83, 023706 (2012)] published Fri Feb 10, 2012. The long range voice coil atomic force microscope http://link.aip.org/link/?RSI/83/023705/1&agg=rss H. Barnard, C. Randall, D. Bridges, and P. K. Hansma<br/> Most current atomic force microscopes (AFMs) use piezoelectric ceramics for scan actuation. Piezoelectric ceramics provide precision motion with fast response to applied voltage potential. A drawback to piezoelectric ceramics is their inherently limited ranges. For many samples this is a nonissue, a ... [Rev. Sci. Instrum. 83, 023705 (2012)] published Thu Feb 9, 2012. 3D mechanical measurements with an atomic force microscope on 1D structures http://link.aip.org/link/?RSI/83/023704/1&agg=rss Christian Kallesoe, Martin B. Larsen, Peter Boggild, and Kristian Molhave<br/> We have developed a simple method to characterize the mechanical properties of three dimensional nanostructures, such as nanorods standing up from a substrate. With an atomic force microscope the cantilever probe is used to deflect a horizontally aligned nanorod at different positions along the nano ... [Rev. Sci. Instrum. 83, 023704 (2012)] published Thu Feb 9, 2012. A nanopositioner for scanning probe microscopy: The KoalaDrive http://link.aip.org/link/?RSI/83/023703/1&agg=rss Vasily Cherepanov, Peter Coenen, and Bert Voigtlander<br/> We present a new type of piezoelectric nanopositioner called KoalaDrive which can have a diameter less than 2.5 mm and a length smaller than 10 mm. The new operating principle provides a smooth travel sequence and avoids shaking which is intrinsic to nanopositioners based on inertial motion with saw ... [Rev. Sci. Instrum. 83, 023703 (2012)] published Tue Feb 7, 2012. Effectiveness of frequency mapping on 28 nm device broken scan chain failures http://link.aip.org/link/?RSI/83/023702/1&agg=rss S. H. Goh, Yan Pan, G. F. You, Y. H. Chan, He ran et al.<br/> Frequency mapping methodology is an effective diagnostic tool for detection of manufacturing defects in scan chains. It analyses reflected laser modulations from toggling scan cells to localize defective scan path or scan cell. In this paper, we demonstrate experimentally that the use of solid immer ... [Rev. Sci. Instrum. 83, 023702 (2012)] published Mon Feb 6, 2012. A new TriBeam system for three-dimensional multimodal materials analysis http://link.aip.org/link/?RSI/83/023701/1&agg=rss McLean P. Echlin, Alessandro Mottura, Christopher J. Torbet, and Tresa M. Pollock<br/> The unique capabilities of ultrashort pulse femtosecond lasers have been integrated with a focused ion beam (FIB) platform to create a new system for rapid 3D materials analysis. The femtosecond laser allows for in situ layer-by-layer material ablation with high material removal rates. The high puls ... [Rev. Sci. Instrum. 83, 023701 (2012)] published Fri Feb 3, 2012. Simple electronics for inertial and Pan-type piezoelectric positioners used in scanning probe microscopes http://link.aip.org/link/?RSI/83/013708/1&agg=rss LeuJen Chen, Seong Heon Kim, Alfred K. H. Lee, and Alex de Lozanne<br/> We describe a new type of circuit designed for driving piezoelectric positioners that rely on the stick-slip phenomenon. The circuit can be used for inertial positioners that have only one piezoelectric element (or multiple elements that are moved simultaneously) or for designs using a sequential mo ... [Rev. Sci. Instrum. 83, 013708 (2012)] published Tue Jan 31, 2012. High-speed force load in force measurement in liquid using scanning probe microscope http://link.aip.org/link/?RSI/83/013707/1&agg=rss Yan Zhang and Qingze Zou<br/> This article presents an inversion-based iterative feedforward-feedback (II-FF/FB) approach to achieve high-speed force load in force measurement of soft materials in liquid using scanning probe microscope (SPM). SPM force measurement under liquid environment is needed to interrogate a wide range of ... [Rev. Sci. Instrum. 83, 013707 (2012)] published Thu Jan 26, 2012. Rapid measurement of a high step microstructure with 90 degrees steep sidewall http://link.aip.org/link/?RSI/83/013706/1&agg=rss Bing-Feng Ju, Yuan-Liu Chen, Wei Zhang, and F. Z. Fang<br/> A prototype STM system with high aspect ratio measurement capability is developed to fulfill accurate profile measurement of a high step microstructure with 90 degrees steep sidewall. Distinguished from the traditional STM, the new system consists of a long range piezoelectric (PZT) actuator with f ... [Rev. Sci. Instrum. 83, 013706 (2012)] published Thu Jan 19, 2012. Circular multilayer zone plate for high-energy x-ray nano-imaging http://link.aip.org/link/?RSI/83/013705/1&agg=rss Takahisa Koyama, Hidekazu Takano, Shigeki Konishi, Takuya Tsuji, Hisataka Takenaka et al.<br/> A circular multilayer zone plate (MZP) was fabricated and its focusing performance was evaluated using 20-keV x-rays. MoSi and Si layers were alternately deposited by DC magnetron sputtering on a wire core; all the interfaces satisfied the Fresnel zone condition. The measured line spread function wa ... [Rev. Sci. Instrum. 83, 013705 (2012)] published Tue Jan 17, 2012. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties http://link.aip.org/link/?RSI/83/013704/1&agg=rss Mokrane Boudaoud, Yassine Haddab, Yann Le Gorrec, and Philippe Lutz<br/> The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM ... [Rev. Sci. Instrum. 83, 013704 (2012)] published Fri Jan 13, 2012. Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head http://link.aip.org/link/?RSI/83/013703/1&agg=rss E.-T. Hwu, H. Illers, W.-M. Wang, I.-S. Hwang, L. Jusko et al.<br/> In this work, an anti-drift and auto-alignment mechanism is applied to an astigmatic detection system (ADS)-based atomic force microscope (AFM) for drift compensation and cantilever alignment. The optical path of the ADS adopts a commercial digital versatile disc (DVD) optical head using the astigma ... [Rev. Sci. Instrum. 83, 013703 (2012)] published Wed Jan 11, 2012. Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator http://link.aip.org/link/?RSI/83/013702/1&agg=rss Daniel Kiracofe, John Melcher, and Arvind Raman<br/> Dynamic atomic force microscopy (dAFM) continues to grow in popularity among scientists in many different fields, and research on new methods and operating modes continues to expand the resolution, capabilities, and types of samples that can be studied. But many promising increases in capability are ... [Rev. Sci. Instrum. 83, 013702 (2012)] published Thu Jan 5, 2012. Probing local surface conductance using current sensing atomic force microscopy http://link.aip.org/link/?RSI/83/013701/1&agg=rss Yucong Liu, Jiayu He, Osung Kwon, and Da-Ming Zhu<br/> We have analyzed correlations between surface morphology and current sensing images obtained using a current sensing atomic force microscope (CSAFM) and the implication of surface conductivity derived from the current sensing images. We found that in cases where the diameter of a CSAFM probe tip is ... [Rev. Sci. Instrum. 83, 013701 (2012)] published Tue Jan 3, 2012. Scanning properties of a resonant fiber-optic piezoelectric scanner http://link.aip.org/link/?RSI/82/123707/1&agg=rss Zhi Li, Zhe Yang, and Ling Fu<br/> We develop a resonant fiber-optic scanner using four piezoelectric elements arranged as a square tube, which is efficient to manufacture and drive. Using coupled-field model based on finite element method, scanning properties of the scanner, including vibration mode, resonant frequency, and scanning ... [Rev. Sci. Instrum. 82, 123707 (2011)] published Wed Dec 28, 2011. Developments of scanning probe microscopy with stress/strain fields http://link.aip.org/link/?RSI/82/123706/1&agg=rss H. X. Guo and D. Fujita<br/> An innovative stress/strain fields scanning probe microscopy in ultra high vacuum (UHV) environments is developed for the first time. This system includes scanning tunneling microscope (STM) and noncontact atomic force microscope (NC-AFM). Two piezo-resistive AFM cantilever probes and STM probes use ... [Rev. Sci. Instrum. 82, 123706 (2011)] published Mon Dec 19, 2011. Airtight container for the transfer of atmosphere-sensitive materials into vacuum-operated characterization instruments http://link.aip.org/link/?RSI/82/123705/1&agg=rss Romain M. Gaume and Lydia-Marie Joubert<br/> This paper describes the design and operation of a simple airtight container devised to facilitate the transfer of atmosphere-sensitive samples from a glovebox to the vacuum chamber of an analytical instrument such as a scanning electron microscope. The use of this device for characterizing the micr ... [Rev. Sci. Instrum. 82, 123705 (2011)] published Wed Dec 14, 2011. A combined scanning tunneling microscopeatomic layer deposition tool http://link.aip.org/link/?RSI/82/123704/1&agg=rss James F. Mack, Philip B. Van Stockum, Hitoshi Iwadate, and Fritz B. Prinz<br/> We have built a combined scanning tunneling microscopeatomic layer deposition (STM-ALD) tool that performs in situ imaging of deposition. It operates from room temperature up to 200 degrees C, and at pressures from 1 x 10 Torr to 1 x 10 Torr. The STM-ALD system has a complete passive vibration ... [Rev. Sci. Instrum. 82, 123704 (2011)] published Wed Dec 14, 2011. Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed http://link.aip.org/link/?RSI/82/123703/1&agg=rss Brian J. Kenton, Andrew J. Fleming, and Kam K. Leang<br/> The mechanical design of a high-bandwidth, short-range vertical positioning stage is described for integration with a commercial scanning probe microscope (SPM) for dual-stage actuation to significantly improve scanning performance. The vertical motion of the sample platform is driven by a stiff and ... [Rev. Sci. Instrum. 82, 123703 (2011)] published Tue Dec 13, 2011. Fabrication of nanoscale patterns in lithium fluoride crystal using a 13.5 nm Schwarzschild objective and a laser produced plasma source http://link.aip.org/link/?RSI/82/123702/1&agg=rss Xin Wang, Baozhong Mu, Li Jiang, Jingtao Zhu, Shengzhen Yi et al.<br/> Lithium fluoride (LiF) crystal is a radiation sensitive material widely used as EUV and soft x-ray detector. The LiF-based detector has high resolution, in principle limited by the point defect size, large field of view, and wide dynamic range. Using LiF crystal as an imaging detector, a resolution ... [Rev. Sci. Instrum. 82, 123702 (2011)] published Mon Dec 12, 2011. A 24 keV liquid-metal-jet x-ray source for biomedical applications http://link.aip.org/link/?RSI/82/123701/1&agg=rss D. H. Larsson, P. A. C. Takman, U. Lundstrom, A. Burvall, and H. M. Hertz<br/> We present a high-brightness 24-keV electron-impact microfocus x-ray source based on continuous operation of a heated liquid-indium/gallium-jet anode. The 3070 W electron beam is magnetically focused onto the jet, producing a circular 713 [mu]m full width half maximum x-ray spot. The measured spectr ... [Rev. Sci. Instrum. 82, 123701 (2011)] published Thu Dec 1, 2011.