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1.  Effect of Postoxidation Annealing on Si/SiO2 Interface Roughness 
Xidong Chen and J. M. Gibson
J. Electrochem. Soc. 146, 3032 (1999)  Full Text: [   PDF (1918 kB) ]   Order Document
2.  Strained interface of lattice-mismatched wafer fusion 
Z. L. Liau
Phys. Rev. B 55, 12899 (1997)  Full Text: [   [ PROLA Link ] ]   Order Document
3.  Interface structure in colored DLA model 
V. Tchijov, S. Rodriguez-Romo, and S. Nechaev
JETP Lett. 64, 549 (1996)  Full Text: [   PDF (120 kB) ]   Order Document
4.  Evolution of interfacial roughness correlation in the formation of multilayer structures 
V. A. Bushuev and V. V. Kozak
Tech. Phys. Lett. 22, 789 (1996)  Full Text: [   PDF (61 kB) ]   Order Document
5.  Study on interface abruptness of InxGa1 – xAs/InyGa1 – yAszP1 – z heterostructures grown by gas-source molecular beam epitaxy 
W. G. Bi and C. W. Tu
J. Vac. Sci. Technol. B 14, 2918 (1996)  Full Text: [   PDF (104 kB) ]   Order Document
6.  Chemically induced step edge diffusion barriers: Dendritic growth in 2D alloys 
R. Q. Hwang
Phys. Rev. Lett. 76, 4757 (1996)  Full Text: [   [ PROLA Link ] ]   Order Document
7.  Interfacial roughness of Fe–Cr GMR superlattices (abstract) (A)
W. Dmowski, T. Egami, D. Kelly, and I. Schuller
J. Appl. Phys. 79, 6253 (1996)  Full Text: [   PDF (22 kB) ]   Order Document
8.  Comparative study of the interface roughness of Ag/Au and Cu/Au multilayers with scanning tunneling microscopy and x-ray diffraction 
I. Heyvaert, K. Temst, C. Van Haesendonck, and Y. Bruynseraede
J. Vac. Sci. Technol. B 14, 1121 (1996)  Full Text: [   PDF (261 kB) ]   Order Document
9.  Crystallographic tilting in high-misfit (100) semiconductor heteroepitaxial systems 
Ferenc Riesz
J. Vac. Sci. Technol. A 14, 425 (1996)  Full Text: [   PDF (117 kB) ]   Order Document
10.  Suppression of thermally induced reactions at SiO2/single-crystalline Al interfaces 
Y. Miura and K. Hirose
J. Appl. Phys. 79, 559 (1996)  Full Text: [   PDF (477 kB) ]   Order Document
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